The lecture will introduce the students to the basic concept of microscopic techniques starting from the fundamental principles of microscopy (components, basic optical theory). Further, the lecture will cover variations in optical microscopy (widefield, confocal, brightfield vs. darkfield, fluorescence microscopy, high-resolution microscopy) and the principle of force microscopy (AFM). The main focus will be electron microscopy with a general introduction to SEM and TEM and an in-depth lecture about SEM and EDX, which will be deepened with an additional 4 hours of practical hands-on sessions.
Completion of the course will give students the possibility of using and booking the institute’s SEM.
Sign up to the course here until 1st of March 2025.
Course Outline:
- History of Microscopy – basic optics and components of a microscope
- Optical microscopy – comparison between different techniques; how to overcome
the resolution limits (I5M, 4π and STED) and fluorescent microscopy - AFM
- Principle of electron microscopy, electron-material interaction, SEM vs. TEM
- SEM – backscattered, EDX, limitation, artefacts
- SEM – examples, what is a good image and what’s not
- And other things that come up during the classes
- Practical SEM session
The lectures will be held on Wednesdays at 16.00 in the lecture room SNŚ. The first lecture will be on March 5.
The final part of the course is a practical training in small groups (3 students) where handling of the microscope, mounting samples, adjusting the image etc. will be shown and tested.
For passing the course the students should perform measurements on a test sample and write a short report showing the ability to take images and analyse the information from these.
Lecture slides (might change at any time): Lecture 1, Lecture 2,
Sign up for the practicals will be opened at a later date. The link will be here. The practicals will take place in the SEM-room at the bottom floor of building 4. The time is from 10-14 if nothing else is agreed.
Recommended reading and links
BRIEF INTRODUCTION TO SCANNING ELECTRON MICROSCOPY (SEM) (Sem-intro – author unknown)
Scanning Electron Microscopy and X-ray Microanalysis, Goldstein, J., Newbury, D.E., Joy, D.C., Lyman, C.E., Echlin, P., Lifshin, E., Sawyer, L., Michael, J.R., Springer 2003. Electronic version available from IChF IP here. (Starting to get a bit old, but still regarded as a bible for SEM).
MC_W95 is (an ancient) program for electron impact Monte Carlo simulations from the Goldstein book to play with.
Light Microscopy-Superresolution Microscopy tutorials on several imaging techniques/components:
– http://zeiss-campus.magnet.fsu.edu/index.html
– https://www.microscopyu.com/tutorials
Online book/explanation for SEM/TEM and related topics:
– https://www.globalsino.com/EM
Try first…
– https://myscope.training/SEM_simulator.html
Online training for SEM/TEM, including SPM and Light Microscopy
– https://myscope.training
For questions please contact Martin Jönsson-Niedziółka.