The lecture will introduce the students to the basic concept of microscopic techniques starting from the fundamental principles of microscopy (components, basic optical theory). Further, the lecture will cover variations in optical microscopy (widefield, confocal, brightfield vs. darkfield, fluorescence microscopy, high-resolution microscopy) and the principle of force microscopy (AFM). The main focus will be electron microscopy with a general introduction to SEM and TEM and an in-depth lecture about SEM and EDX, which will be deepened with an additional 4 hours of practical hands-on sessions.
Completion of the course will give students the possibility of using and booking the institute’s SEM. Registration can be done through the link here.
Tentative course outline:
- Foundations of Microscopy – basic optics, history and components of a microscope (2h).
- Optical microscopy – comparison between different techniques; how to overcome the resolution limits (I5M, 4π, STED, etc.) and fluorescent microscopy (3h).
- AFM (1h).
- Principle of electron microscopy, electron-material interaction, SEM vs. TEM (3h).
- SEM – backscattered, EDX, limitation, artefacts (2h).
- SEM – examples, what is a good image and what’s not (1h).
- Practical SEM session (4h).
The course is held Tuesdays at 16.00-18.00 in the Conference Room, IChF, starting on Feb 24, 2026.
Lecture slides: Lecture 1, Lecture 2, Lecture 3, Lecture 4-6
The final part of the course is a practical training in small groups (3 students) where handling of the microscope, mounting samples, adjusting the image etc. will be shown and tested.
In lieu of a traditional exam, students should perform measurements on a test sample and write a short report demonstrating their ability to take images and analyse the information from them.
Sign up for the practical session: HERE
Recommended reading and links
BRIEF INTRODUCTION TO SCANNING ELECTRON MICROSCOPY (SEM) (Sem-intro – author unknown)
Scanning Electron Microscopy and X-ray Microanalysis, Goldstein, J., Newbury, D.E., Joy, D.C., Lyman, C.E., Echlin, P., Lifshin, E., Sawyer, L., Michael, J.R., Springer 2003. Electronic version available from IChF IP here. (Starting to get a bit old, but still regarded as a bible for SEM).
MC_W95 is (an ancient) program for electron impact Monte Carlo simulations from the Goldstein book to play with.
Light Microscopy-Superresolution Microscopy tutorials on several imaging techniques/components:
– http://zeiss-campus.magnet.fsu.edu/index.html
– https://www.microscopyu.com/tutorials
Online book/explanation for SEM/TEM and related topics:
– https://www.globalsino.com/EM
Try first…
– https://myscope.training/SEM_simulator.html
Online training for SEM/TEM, including SPM and Light Microscopy
– https://myscope.training
For questions please contact Martin Jönsson-Niedziółka.