The course will cover the basic modes of operation of SEM, sample preparation, x-ray spectroscopy and a description of the capabilities of our in-house microscope and other extended features. The course includes 4 hours of lectures (via zoom) and 4 hours of practical hands-on SEM imaging in small groups after which the students will be allowed to book and use the instrument on their own. To sign up please fill in the form here.
The schedule looks as follows:
First lecture, (2023-04-18, 12.00 in the Lecture hall).
- Principles of operation
- Back-scattered vs secondary electrons
- Different detectors
Second lecture, (2023-04-20, 12.00 in the Lecture hall).
- Sample preparation
- EDX/WDX spectrocopy (given by Dr. Marcin Hołdyński)
The final part of the course is a practical training in small groups (3 students) where handling of the microscope, mounting samples, adjusting the image etc. will be shown and tested.
For passing the course the students should perform measurements on a test sample and write a short report showing the ability to take images and analyse the information from these.
Sign up for the practicals here (link).
BRIEF INTRODUCTION TO SCANNING ELECTRON MICROSCOPY (SEM) (Sem-intro – author unknown)
Scanning Electron Microscopy and X-ray Microanalysis, Goldstein, J., Newbury, D.E., Joy, D.C., Lyman, C.E., Echlin, P., Lifshin, E., Sawyer, L., Michael, J.R., Springer 2003. Electronic version available from IChF IP here. (Starting to get a bit old, but still regarded as a bible for SEM).
MC_W95 is (an ancient) program for electron impact Monte Carlo simulations from the Goldstein book to play with.
For questions please contact Martin Jönsson-Niedziółka.